Toggle navigation
Français
Contact
Search Site
Advanced Search…
Log in
Toggle navigation
About
What is legal metrology
Legal metrology and trade
Legal metrology and safety
Legal metrology and health
Legal metrology and the environment
Memoranda of Understanding
IEC
ISO
UNIDO-BIPM
ILAC-IAF
INetQI
What is the OIML?
70th OIML Anniversary
Organizations in Liaison
Policy and legislation
BIPM/OIML Brochure on D 1
Benefits of OIML membership
Joint declarations
Publications
Basic Publications
Documents
Expert Reports
Guides
Recommendations
Seminar Reports
Vocabularies
Online Vocabularies
Other language translations
OIML Bulletin
Published Editions
2025-02
Editorial
EMC in legal metrology
Static liquid quantity meter
Legal Metrology Information System in Colombia
Digital transparency in legal metrology
Legal metrology in DC metering
2025-03
Editorial
OIML in the digital era
Digital transformation in practice
The FAIR principles: Valid guidelines for legal metrology?
Smart development for smart standards
The Digital Certificate of Conformity
The European Artificial Intelligence Act
OIML DTG Survey 2024
Future Editions
Submitting an article
Structure
Our Members
Member States
Corresponding Members
Conference
Conference Sites, Resolutions, Minutes
17th Conference (2025)
About the BIML
Practical information
Past Directors
Jobs and opportunities
Requests for tenders
CIML
CIML meeting Sites, Resolutions, Minutes
Presidency
Past Presidents
Members of Honour
OIML Awards
OIML Medal
OIML Letter of Appreciation
OIML CEEMS Award
60th CIML Meeting - 17th Conference (2025)
Meeting documents - CIML
Meeting documents - Conference
PHOTOGRAPHS
TCs and SCs
Digitalization Task Group
Introduction
Overview
Digital transformation
SC Smart documents
SC e-Learning
Events
Emerging Metrology Systems (CEEMS)
CEEMS Advisory Group
Advisory Group Membership
OIML Training Centers and Training Events
Training materials
Seminars
List of Experts
OIML CEEMS Award
2022 CEEMS Award
Online learning from the OIML
MetTalks
BIPM/OIML Brochure on D 1
RLMO Round Table
RLMO RT 2024-09-30
RLMO RT 2023-09-26
RLMO RT 2022-09-27
RLMO RT 2021-09-30
RLMO RT 2020-10-08
News & Meetings
News
OIML Seminars
Digital Transformation
OIML Conference
News archive
CIML Meetings
COP30
OIML-CS
OIML-CS Home
Introduction
Categories of measuring instruments
Documents, forms and guidance
Management structure
Info for OIML Issuing Authorities
Info for Utilizers and Associates
Info for manufacturers
News and events
News archive
Search registered certificates
Search OIML Issuing Authorities
Search Utilizers and Associates
Appeals, complaints and disputes
Contact
TC/SC/PG
TCs, SCs and Projects
Committee Drafts
Search (Technical)
Technical liaisons
You are here:
TC/SC/PG
…
TC3
SC1
Contacts
TC3/SC1
Pattern approval and verification
International Electrotechnical Commission
Return
