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• About

  What is legal metrology? Legal metrology and trade Legal metrology and safety Legal metrology and health Legal metrology and the environment Benefits of OIML membership

  Memoranda of Understanding IEC ISO UNIDO-BIPM ILAC-IAF Organizations in Liaison

  What is the OIML? Joint declarations

• Publications

  Introduction Recommendations Guides Final Draft Publications

  OIML Bulletin Past Issues Documents Expert Reports Other language translations

  Vocabularies VIML online Basic Publications Seminar Reports

• Structure

  Our Members Member States Corresponding Members Conference Conference web sites, Resolutions, Minutes 15th Conference Additional Meeting Documents

  CIML CIML meeting web sites, Resolutions, Minutes Presidency Past Presidents Members of Honor Awards Medals Letters of Appreciation OIML CEEMS Award TCs and SCs

  Emerging Metrology Systems (CEEMS) Advisory Group Advisory Group Membership OIML Training Centers OPTC: First OIML NAWI training course OPTC: Legal Metrology Management System Seminar OPTC: Training course on prepackaged goods OPTC: Workshop on prepackaged goods - Cuba Seminars 2015 Chengdu Seminar CEEMS Experts OIML CEEMS Award 2017 - 9th Award 2016 - 8th Award 2015 - 7th Award 2014 - 6th Award 2013 - 5th Award 2012 - 4th Award 2011 - 3rd Award 2010 - 2nd Award 2009 - 1st Award Forthcoming events Hamburg 2018 Seminar "Legal Metrology in Practice" Training materials BIML Practical information Past Directors Jobs and opportunities

• OIML-CS

  General information Documentation OIML Issuing Authorities FORCE (Denmark) FORCE (Brondby) FORCE (Horsholm) FORCE (Vejen) LNE (France) ITRON LNE METAS (Switzerland) METAS Mettler Toledo NIM (P.R. China) BJIM NIM SIMT ZJIM NMi (Netherlands) NMi NMIA (Australia) NMIA NMIJ/AIST (Japan) NMIJ/AIST NMO (United Kingdom) AWTX NMO NSF Sartorius PTB (Germany) Mettler Toledo PTB Sartorius SLM (Slovakia) EVPU SLM Search registered certificates Calendar

  Transition arrangements Application forms Utilizers and Associates Australia Belgium Cambodia Canada Colombia Cuba Denmark France Germany India Japan Korea (R.) Latvia Namibia Netherlands New Zealand P.R. China Slovakia South Africa Switzerland United Kingdom United States Experts Contact

  Structure of the OIML-CS Categories of measuring instruments Info for manufacturers Appeals, complaints & disputes

• Events

  OIML technical meetings OIML Seminars

  OIML Conference

  CIML Meetings

• TC/SC/PG

  TCs, SCs and Projects Committee Drafts

  Search (Technical) Reports & statistics

  Technical liaisons

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