The OIML and the IEC (International Electrotechnical Commission) have concluded an agreement, in the form of a “Memorandum of Understanding” (MoU), covering the relationship between the two organizations in matters of technical cooperation, conformity assessment and the development and application of standards.
The MoU was signed during a special ceremony that took place in Prague, on 13 October 2011, as part of the 46th CIML Meeting. Signing the MoU were Mr. Pierre de Ruvo on behalf of the former Secretary General and CEO of the IEC, Mr. Aharon Amit, who could not be present and Peter Mason, CIML President. Mr. De Ruvo is the Executive Secretary of the IECEE, IEC’s conformity assessment system for electrotechnical equipment.
Mr. De Ruvo also represented the IEC in the working group that drafted the MoU. The OIML representatives on that group were Roman Schwartz, CIML Vice-President, and Ian Dunmil and Willem Kool of the BIML.
The text of the MoU was reviewed by the members of CIML Presidential Council and discussed at their meeting in March 2011. The Presidential Council agreed with the text, but felt that the following clarifications should be provided to the OIML community:
The text of the MoU was then submitted to the CIML for approval. With Resolution no. 10 of its 46th Meeting (11-14 October 2011), the CIML approved the MoU and instructed the BIML to commence the drawing up of a joint OIML-IEC work program. Some of the elements of such a work program have already been identified by the working group that drafted the MoU and include:
Signing of the new IEC-OIML MoU in Prague, 13 October 2011.
Left: Mr. Pierre de Ruvo on behalf of the Secretary General and CEO of the IEC
Right: Mr. Peter Mason, CIML President