Français
Contact

Search Site

Advanced Search…

Log in

About
- What is legal metrology
- What is the OIML?
  - 70th OIML Anniversary
- Benefits of OIML membership
- Memoranda of Understanding
Publications
- OIML Bulletin
Structure
- CIML
OIML-CS
Technical work
- TCs, SCs and Projects
- Search (Technical)
- Technical liaisons
- Committee Drafts
News, Meetings, Training
- News
- OIML Conference
- CIML Meetings
- Online learning
  - MetTalks
- OIML Seminars
  - Digital Transformation

You are here:

Files
Thumbnails (Recommendations)
R 15:1974 (en)

R 15:1974 (en) https://www.oiml.org/en/files/thumbnails_r/r015-e74.jpg/view https://www.oiml.org/en/files/thumbnails_r/r015-e74.jpg/@@download/image/r015-e74.jpg

R 15:1974 (en)

R 15:1974 (en) — Click to view full-size image… Size: 48.3 KB

World Metrology Day 2026

World Metrology Day 2026

Read more

61st CIML Meeting

61st CIML Meeting

Read more

OIML Bulletin - 2026 No. 3

OIML Bulletin - 2026 No. 3

Read more

News and updates

News and updates

Read more

Publications

Publications

Read more

Online Learning

Online Learning

Read more

Contact BIML Staff
Practical Info
Disclaimer
Privacy and data protection policy
Webmaster

BIML - 11 rue Turgot - 75009 Paris - France - Tel +33 1 48 78 12 82 - Fax +33 1 42 82 17 27

© Copyright OIML 2021

Web design: rouge-pixel.com