Skip to content. | Skip to navigation

Sections

• About

  What is legal metrology? Legal metrology and trade Legal metrology and safety Legal metrology and health Legal metrology and the environment Benefits of OIML membership

  Memoranda of Understanding IEC ISO UNIDO-BIPM ILAC-IAF Organizations in Liaison

  What is the OIML? Joint declarations

• Publications

  Introduction Recommendations Guides Final Draft Publications

  OIML Bulletin Past Issues Documents Expert Reports Other language translations Arabic Persian Polish Portuguese Russian Serbian Spanish Ukrainian

  Vocabularies Online Vocabularies Basic Publications Seminar Reports

• Structure

  Our Members Member States Corresponding Members Conference Conference web sites, Resolutions, Minutes 15th Conference Additional Meeting Documents

  CIML CIML meeting web sites, Resolutions, Minutes 54th CIML Additional Meeting Documents Presidency Past Presidents Members of Honor Awards Medals Letters of Appreciation OIML CEEMS Award TCs and SCs

  Emerging Metrology Systems (CEEMS) Advisory Group Advisory Group Membership OIML Training Centers OPTC: First OIML NAWI training course OPTC: Legal Metrology Management System Seminar OPTC: Training course on prepackaged goods OPTC: Workshop on prepackaged goods - Cuba OTC: Seminar on the OIML-CS - China Seminars 2015 Chengdu Seminar 2018 Hamburg Seminar "Legal Metrology in Practice" List of Experts OIML CEEMS Award 2017 - 9th Award 2016 - 8th Award 2015 - 7th Award 2014 - 6th Award 2013 - 5th Award 2012 - 4th Award 2011 - 3rd Award 2010 - 2nd Award 2009 - 1st Award Training materials e-Learning Platform About the BIML Practical information Past Directors Jobs and opportunities

• OIML-CS

  General information Documentation OIML Issuing Authorities CMI (Czech Republic) CMI Testing Laboratory Czech Metrology Institute FORCE (Denmark) FORCE (Brondby) FORCE (Horsholm) FORCE (Vejen) LNE (France) ITRON LNE METAS (Switzerland) METAS Mettler Toledo Sartorius NIM (P.R. China) BJIM NIM SIMT ZJIM NMi (Netherlands) NMi NMIA (Australia) NMIA NMIJ/AIST (Japan) NMIJ/AIST NMO (United Kingdom) AWTX NMO NSF Sartorius PTB (Germany) Bizerba Mettler Toledo PTB Sartorius RISE (Sweden) RISE SLM (Slovakia) EVPU SLM Search registered certificates Calendar

  Transition arrangements Application forms Utilizers and Associates Australia Belgium Cambodia Canada Colombia Cuba Czech Republic Denmark France Germany India Japan Kenya Kiribati Korea (R.) Latvia Namibia Netherlands New Zealand P.R. China Russian Federation Saudi Arabia Slovakia South Africa Sweden Switzerland Tunisia United Kingdom United States Zambia Experts Contact

  Structure of the OIML-CS Categories of measuring instruments Info for manufacturers Appeals, complaints & disputes

• Events

  OIML technical meetings OIML Seminars

  OIML Conference

  CIML Meetings

• TC/SC/PG

  TCs, SCs and Projects Committee Drafts

  Search (Technical) Reports & statistics

  Technical liaisons