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Last updated: 29 April 2008
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7th International Symposium "METROLOGY 2008"
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27-29 May 2008
Havana, Cuba
The Cuban National Bureau of Standards (NC), the Ministry
of Science, Technology and the Environment (CITMA) and the Metrology
Research Institute (INIMET) and other national and international organizations
specialized in metrology are pleased to announce the 7th International
Symposium of Metrology, to be held in Havana's International Conference
Center on 27-29 May 2008, under the sponsorship of the International
Organization of Legal Metrology (OIML).
The Organizing Committee hereby invites all interested
specialists, experts and managers who work as metrology researchers,
planners and trainers, as well as representatives of organizations and
companies in which measuring instruments and means are manufactured,
verified, calibrated and/or commercialized, to take part in this event
where the following topics will be discussed:
* Legal metrology and its fields of application
* Measurement traceability and uncertainty
* Metrology and quality
* Measurement in the field of energy and fuels
* Chemical metrology
* Metrology and the environment
* Metrology and health
For further information, please contact: metrologia2008@ncnorma.cu
www.nc.cubaindustria.cu
Download the PDF
file of the Second Announcement, 5 November 2007
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Conference on advanced mathematical and computational
tools in metrology and testing
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23-25 June 2008
ENS Cachan, Paris, France
Jointly organized by IMEKO TC21 Advanced Mathematical
Tools for Measurements and the CFM Collège Français
de Métrologie, the general aims of the Conference are:
* To present and promote reliable and effective mathematical
and computational tools in metrology;
* To understand better the modelling, statistical and computational
requirements in metrology;
* To provide a forum for metrologists, mathematicians and software engineers
that will encourage a more effective synthesis of skills, capabilities
and resources;
* To promote collaboration in the context of EU and International Programmes;
* To support young researchers in metrology and related fields, also
through training;
* To address industrial requirements;
* To cover both fields of calibration and testing.
First Announcement and call for papers. For more information,
please refer to www.cfmetrologie.com/amctm08.php
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2008 NCSL International Workshop and Symposium
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3-7 August 2008,
Orlando, Florida, USA
NCSL International, a professional association for individuals
engaged in all aspects of international measurement science, announces
that its 2008 International Workshop and Symposium will be held in Orlando,
Florida (USA) on August 3-7, 2008 with Tutorials on August 2, 3 and
8, 2008.
Metrology's Impact on Business
Why should your business have an interest in metrology? If the goal
of your business is to make a quality product or service, and ultimately
a profit, then metrology has a direct impact on your business. Metrology
is the science of measurement, and measurements are critical to industry.
The quality of measurements made during design and manufacturing will
directly affect the quality of a product, and poor measurements may
even mean scrapping products entirely. Conversely, precision measurements
and state-of-the-art capabilities may lead to patents and superior products,
giving one company an edge over its competition. From research and development
to shipping and receiving, measurements matter to business.
Highlights:
* 27 Technical Tutorials on a wide variety of Measurement solutions
* 5 Parallel Tracks of papers, presentations and panels packed with
technical training
* More than 120 leading industry Exhibitors and Demonstrations
NCSL International was formed in 1961 to promote cooperative efforts
for solving the common problems faced by measurement laboratories; NCSL
International is a non-profit organization whose membership is open
to any organization or individual with an interest in the science of
measurement and its application in research, development, education,
or commerce.
For more information about our conference, visit www.ncsli.org/conference,
or call (1) 303-440-3339.
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22-24 October 2008
Queretaro, Mexico
The National Centre of Metrology (CENAM) is organizing
the Simposio de Metrología 2008 as a means to exchange knowledge
and to share experiences on measurement science and technology.
During three days, representatives of public and private
calibration and testing laboratories, industry, research centers and
academic institutions, and national metrology institutes from various
countries will discuss and share their problems and solutions to the
constant challenge of accurate measurement, as a key support for technological
innovation and to assure the quality of products and services.
Participants from national metrology institutes, inspection
authorities, government agencies, universities, research centres, commercial
laboratories and other interested parties will take part in this Symposium.
Nationally and internationally recognized specialists
in various measurement fields will participate in plenary sessions and
there will be contributions from those involved in the daily task of
measuring: they will present results and discuss their difficulties
with the aim of obtaining proposals for improvement. In addition, specialized
work meetings will be held where topical issues will be discussed.
A specialized industrial exhibition of measuring instruments,
analytical equipment and related products, will show attendees the current
technology in this field, with the help of manufacturers' representatives
and suppliers of calibration and testing services.
Three additional activities will add value to this Symposium:
Plenary sessions, two poster sessions to provide networking between
specialists and colleagues from different fields in metrology, and a
program of short courses / workshops, prior to the Symposium, on important
current metrological issues.
We look forward to welcoming you and your colleagues
at the Simposio de Metrología 2008.
For more information, please refer to www.cenam.mx/simposio2008/eng/descripcion.aspx
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International Symposium: "Metrology,
testing, and accreditation - breaking the trading barriers"
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12-15 November 2008
Cavtat, Dubrovnik, Croatia
IMEKO TC 11 "Metrological Infrastructure"
is organizing an International Symposium in November 2008. The aim is
to bring together International Organizations including the BIPM, OIML,
and ILAC, and Regional Metrology Organizations (RMO's). Representatives
of these international organizations and the chairpersons of the RMOs
will describe the functioning of their organizations. Representatives
of National Metrology Institutes (NMIs) will be invited to present their
work and to discuss key topics and challenges.
International Technical Sessions:
- Mass and related quantities (including force, pressure, air density,
torque, viscosity and hardness)
- Electricity and magnetism (including RF and microwave)
- Length, form measurements, complex geometry, angular measurements
- Laser measurements, nanometrology, surface texture
- Time and frequency
- Thermometry (including thermophysical properties and humidity)
- Ionizing radiation (including radiometry and dosimetry)
- Photometry and radiometry (including fiber optics)
- Flow (including fluid properties)
- Acoustics, ultrasound and vibration (including accelerometry)
- Amount of substance
For further information, please visit: www.rmo2008.org
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17th International Conference of the Israel Society
for Quality
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First Announcement and Call for Papers
18-20 November 2008
Jerusalem, Israel
The conference program will incorporate a wide variety
of subjects in which many dimensions will be explored.
Topics will relate to industries such as:
Biotechnology
Alternative energy
Aerospace
Electronics
Pharmaceuticals
Food
Process
Medical equipment and sectors such as:
Small Organizations
Start-ups
e-business
Services
Banks and Insurance
Hotels
Public
Education
Transportation
Infrastructure
Health
Marketing
This year, among others, topics will focus on:
The Strategy and the Future of Quality Management
The Role of the Quality Manager
Quality Education
Organizational Excellence
Environmental Quality
Information Security
Safety
Business Continuity Management
Homeland Security
Project Assurance
Innovations in Standardization
RAMS
Metrology
You are invited to submit abstracts in all areas of quality and quality
management. Joining us at the Conference will enable you to both participate
in a stimulating and challenging learning experience and enjoy exploring
Israel.
Further information: PDF
file - Web site: www.isas.co.il/quality2008
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14th International Metrology Congress
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22-25 June 2009
Palais des Congrès, Paris, France
The Congress is a meeting place for specialists in metrology
from firms and scientific laboratories through oral and poster conferences,
an exhibition of equipment and services, and technical visits to firms.
The aim of the Congress is to improve measurement in industry and laboratories.
This event will gather together over 800 people from
50 different countries, and from every circle concerned with measurement:
* metrologists from companies,
* metrologists from calibration, analysis and testing laboratories,
* manufacturers and users of metrological equipment,
* quality managers, and
* teachers and researchers.
For further information, please visit: www.cfmetrologie.com/congres_en.php
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Milestones in Metrology III
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10-13 May 2009
Rotterdam, The Netherlands
In May 2009 the third Milestones in Metrology
Congress will bring together regulators, manufacturers, end users and
notified bodies to chart out maps for the future of legal metrology.
The Congress hinges around three key fields: oil and
gas, traffic and weighing instruments. Each day will have a specific
theme: global market access, software and future developments. The program
will consist of plenary sessions and parallel streams, and there will
be opportunities to meet colleagues during the evening receptions.
The Congress ties in with the 20th anniversary of NMi,
and will therefore be a special event. Registration is now open (Click
here) and speakers are invited to send in abstracts: this PDF
document gives full details.
For further information, please visit: www.milestonesinmetrology.nl
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