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Events

Last updated: 29 April 2008

 
If you wish to submit an event for inclusion on this page, please contact the Editor


7th International Symposium "METROLOGY 2008"

27-29 May 2008
Havana, Cuba

The Cuban National Bureau of Standards (NC), the Ministry of Science, Technology and the Environment (CITMA) and the Metrology Research Institute (INIMET) and other national and international organizations specialized in metrology are pleased to announce the 7th International Symposium of Metrology, to be held in Havana's International Conference Center on 27-29 May 2008, under the sponsorship of the International Organization of Legal Metrology (OIML).

The Organizing Committee hereby invites all interested specialists, experts and managers who work as metrology researchers, planners and trainers, as well as representatives of organizations and companies in which measuring instruments and means are manufactured, verified, calibrated and/or commercialized, to take part in this event where the following topics will be discussed:

* Legal metrology and its fields of application
* Measurement traceability and uncertainty
* Metrology and quality
* Measurement in the field of energy and fuels
* Chemical metrology
* Metrology and the environment
* Metrology and health

For further information, please contact: metrologia2008@ncnorma.cu
www.nc.cubaindustria.cu

Download the PDF file of the Second Announcement, 5 November 2007


Conference on advanced mathematical and computational tools in metrology and testing

23-25 June 2008
ENS Cachan, Paris, France

Jointly organized by IMEKO TC21 “Advanced Mathematical Tools for Measurements” and the CFM “Collège Français de Métrologie”, the general aims of the Conference are:

* To present and promote reliable and effective mathematical and computational tools in metrology;
* To understand better the modelling, statistical and computational requirements in metrology;
* To provide a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources;
* To promote collaboration in the context of EU and International Programmes;
* To support young researchers in metrology and related fields, also through training;
* To address industrial requirements;
* To cover both fields of calibration and testing.

First Announcement and call for papers. For more information, please refer to www.cfmetrologie.com/amctm08.php


2008 NCSL International Workshop and Symposium

3-7 August 2008,
Orlando, Florida, USA

NCSL International, a professional association for individuals engaged in all aspects of international measurement science, announces that its 2008 International Workshop and Symposium will be held in Orlando, Florida (USA) on August 3-7, 2008 with Tutorials on August 2, 3 and 8, 2008.

Metrology's Impact on Business

Why should your business have an interest in metrology? If the goal of your business is to make a quality product or service, and ultimately a profit, then metrology has a direct impact on your business. Metrology is the science of measurement, and measurements are critical to industry.

The quality of measurements made during design and manufacturing will directly affect the quality of a product, and poor measurements may even mean scrapping products entirely. Conversely, precision measurements and state-of-the-art capabilities may lead to patents and superior products, giving one company an edge over its competition. From research and development to shipping and receiving, measurements matter to business.

Highlights:

* 27 Technical Tutorials on a wide variety of Measurement solutions
* 5 Parallel Tracks of papers, presentations and panels packed with technical training
* More than 120 leading industry Exhibitors and Demonstrations

NCSL International was formed in 1961 to promote cooperative efforts for solving the common problems faced by measurement laboratories; NCSL International is a non-profit organization whose membership is open to any organization or individual with an interest in the science of measurement and its application in research, development, education, or commerce.

For more information about our conference, visit www.ncsli.org/conference, or call (1) 303-440-3339.


Symposium of Metrology

22-24 October 2008
Queretaro, Mexico

The National Centre of Metrology (CENAM) is organizing the Simposio de Metrología 2008 as a means to exchange knowledge and to share experiences on measurement science and technology.

During three days, representatives of public and private calibration and testing laboratories, industry, research centers and academic institutions, and national metrology institutes from various countries will discuss and share their problems and solutions to the constant challenge of accurate measurement, as a key support for technological innovation and to assure the quality of products and services.

Participants from national metrology institutes, inspection authorities, government agencies, universities, research centres, commercial laboratories and other interested parties will take part in this Symposium.

Nationally and internationally recognized specialists in various measurement fields will participate in plenary sessions and there will be contributions from those involved in the daily task of measuring: they will present results and discuss their difficulties with the aim of obtaining proposals for improvement. In addition, specialized work meetings will be held where topical issues will be discussed.

A specialized industrial exhibition of measuring instruments, analytical equipment and related products, will show attendees the current technology in this field, with the help of manufacturers' representatives and suppliers of calibration and testing services.

Three additional activities will add value to this Symposium: Plenary sessions, two poster sessions to provide networking between specialists and colleagues from different fields in metrology, and a program of short courses / workshops, prior to the Symposium, on important current metrological issues.

We look forward to welcoming you and your colleagues at the Simposio de Metrología 2008.

For more information, please refer to www.cenam.mx/simposio2008/eng/descripcion.aspx


International Symposium: "Metrology,
testing, and accreditation - breaking the trading barriers"

12-15 November 2008
Cavtat, Dubrovnik, Croatia

IMEKO TC 11 "Metrological Infrastructure" is organizing an International Symposium in November 2008. The aim is to bring together International Organizations including the BIPM, OIML, and ILAC, and Regional Metrology Organizations (RMO's). Representatives of these international organizations and the chairpersons of the RMOs will describe the functioning of their organizations. Representatives of National Metrology Institutes (NMIs) will be invited to present their work and to discuss key topics and challenges.

International Technical Sessions:
- Mass and related quantities (including force, pressure, air density, torque, viscosity and hardness)
- Electricity and magnetism (including RF and microwave)
- Length, form measurements, complex geometry, angular measurements
- Laser measurements, nanometrology, surface texture
- Time and frequency
- Thermometry (including thermophysical properties and humidity)
- Ionizing radiation (including radiometry and dosimetry)
- Photometry and radiometry (including fiber optics)
- Flow (including fluid properties)
- Acoustics, ultrasound and vibration (including accelerometry)
- Amount of substance

For further information, please visit: www.rmo2008.org


17th International Conference of the Israel Society for Quality

First Announcement and Call for Papers

18-20 November 2008
Jerusalem, Israel

The conference program will incorporate a wide variety of subjects in which many dimensions will be explored.
Topics will relate to industries such as:

• Biotechnology
• Alternative energy
• Aerospace
• Electronics
• Pharmaceuticals
• Food
• Process
• Medical equipment and sectors such as:

• Small Organizations
• Start-ups
• e-business
• Services
• Banks and Insurance
• Hotels
• Public
• Education
• Transportation
• Infrastructure
• Health
• Marketing

This year, among others, topics will focus on:

• The Strategy and the Future of Quality Management
• The Role of the Quality Manager
• Quality Education
• Organizational Excellence
• Environmental Quality
• Information Security
• Safety
• Business Continuity Management
• Homeland Security
• Project Assurance
• Innovations in Standardization
• RAMS
• Metrology

You are invited to submit abstracts in all areas of quality and quality management. Joining us at the Conference will enable you to both participate in a stimulating and challenging learning experience and enjoy exploring Israel.

Further information: PDF file - Web site: www.isas.co.il/quality2008


14th International Metrology Congress

22-25 June 2009
Palais des Congrès, Paris, France

The Congress is a meeting place for specialists in metrology from firms and scientific laboratories through oral and poster conferences, an exhibition of equipment and services, and technical visits to firms. The aim of the Congress is to improve measurement in industry and laboratories.

This event will gather together over 800 people from 50 different countries, and from every circle concerned with measurement:

* metrologists from companies,
* metrologists from calibration, analysis and testing laboratories,
* manufacturers and users of metrological equipment,
* quality managers, and
* teachers and researchers.

For further information, please visit: www.cfmetrologie.com/congres_en.php


Milestones in Metrology III

10-13 May 2009
Rotterdam, The Netherlands

In May 2009 the third Milestones in Metrology Congress will bring together regulators, manufacturers, end users and notified bodies to chart out maps for the future of legal metrology.

The Congress hinges around three key fields: oil and gas, traffic and weighing instruments. Each day will have a specific theme: global market access, software and future developments. The program will consist of plenary sessions and parallel streams, and there will be opportunities to meet colleagues during the evening receptions.

The Congress ties in with the 20th anniversary of NMi, and will therefore be a special event. Registration is now open (Click here) and speakers are invited to send in abstracts: this PDF document gives full details.

For further information, please visit: www.milestonesinmetrology.nl